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SPECK SENSORSYSTEME GmbH

住所 〒-
Germany
TEL +493641773520
FAX
URL http://www.optosensoric.de
E-mail speck.sensor@arcor.de
設立年 2004年
Uwe Speck
  最終更新日:2025年03月31日

OPIE '25 出展の見どころ

LID - Measurement of minimal absorptions of optical materials and optical coatings with the highest precision, down to 1 ppm.
CRD - reflectivity measurements for HR mirrors of 99.9998%. Extremely fast measurements in the GHz range of the smallest analog signals with high amplification. Low fluorescent signals also.

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企業PR

SPECK SENSORSYSTEME GmbH specializes in optical precision measurement technology, including the development of measurement and testing systems. They also provide components for image processing, industrial measurement technology, and laboratory applications. SPECK SENSORSYSTEME GmbH stands for precision and innovation. For example, we measure minimal absorptions of optical materials and coatings with the highest precision, down to 1 ppm, or perform reflectivity measurements for HR mirrors with values reaching 99.9998%. Additionally, we enable extremely fast measurements in the GHz range of the smallest analog signals with high amplification. These outstanding achievements set benchmarks in optical precision measurement technology and offer groundbreaking solutions for industrial and scientific applications.

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CRD reflectiviy measurement setup

CRD reflectiviy measurement setup

Cavity-Ringdown measurement systeme for precise evaluation of losses at high-reflective coating of optical components: * Reflectivity is obtained by evalution of losses L with the assumption of R=1-L *Mesurement of losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99% (typical 99.9995% * Measurement of losses at various, discret angles of incidence and s- / p-polarization *Employed laser wavelength(s) selectable on order by user according to the desired target wavelength of coating (e.g 355nm to 1310nm)

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LID absolute absorption measurement setup

LID absolute absorption measurement setup

measurement system for evaluation of ultra low absorption levels in bulk material and coatings: · ultra low absorption levels in bulk material and coatings · Applicable for optical glasses (SiO2, BK7, …), optical crystals (CaF2, YVO4, LiNbO3, …), transparent synthetics (polyacrylates, etc) · Features absolute electrical power calibration, not relying on models or assumptions about the material · Features absolute electrical power calibration, not relying on models or assumptions about the material · determination of the absolute absorption coefficient α ([cm-1] for bulk material) · Sensitivity < 10μW/cm NEP(SiO2) α < 1ppm/cm

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